Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis (Methods of Surface Characterization)

by Alvin Warren Czanderna

Written as a tutorial guide for newcomers to the field of surface analysis, this work is the first book ever published to feature photon, electron, and ion beam effects and beam damage to solids during surface and near-surface analysis and depth profiling. This introductory text describes the principles, techniques, and methods vital for efficient surface analysis. A wealth of practical information is assembled in this single volume, including summary tables, extensive references, and 251 illustrative figures.

Hardcover

First published October 1, 1998

About the author

American Surface scientist. Recipient Industrial Research International Rectifier -100 award, 1977.