Digital Communications Test and Measurement: High-Speed Physical Layer Characterization

by Dennis Derickson (Editor), Ransom Stephens (Contributor), James Prettyleaf (Contributor)

Today's new data communication and computer interconnection systems run at unprecedented speeds, presenting new challenges not only in the design, but also in troubleshooting, test, and measurement. This book assembles contributions from practitioners at top test and measurement companies, component manufacturers,and universities. It brings together information that has never been broadly accessible before—information that was previously buried in application notes, seminar and conference presentations, short courses, and unpublished works. Readers will gain a thorough understanding of the inner workings of digital high-speed systems, and learn how the different aspects of such systems can be tested. The editors and contributors cover key areas in test and measurement of transmitters (digital waveform and jitter analysis and bit error ratio), receivers (sensitivity, jitter tolerance, and PLL/CDR characterization), and high-speed channel characterization (in time and frequency domain). Extensive illustrations are provided throughout. Coverage includes

935 pages, Hardcover

First published November 1, 2007

Reviews

[John Macpherson · Rating 5 out of 5]

Great reference book for telecom techs

[Ransom Stephens · Rating 5 out of 5]

The perfect and overly complete reference for designers of emerging serial-data technologies. Yeah, I would say that, I wrote the second chapter. But it's really true! Jitter and noise, none of this stuff works if the people who design and build it don't understand jitter and noise.