Testing and Reliable Design of CMOS Circuits > Editions

Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science, 88)

Published December 31st 1989 by Springer

1990, Hardcover, 246 pages

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[(Testing and Reliable Design of CMOS Circuits * * )] [Author: N. K. Jha] [Feb-1990]

Published by Kluwer Academic Publishers

Unknown Binding, 0 pages

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Testing and Reliable Design of CMOS Circuits (Paperback)

Published December 31st 1989 by Springer

Paperback, 248 pages

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Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science)

Published September 26th 2011 by Springer

Softcover reprint of the original 1st ed. 1990, Paperback, 246 pages

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